TEST_NAME : Wafer
TEST_DATE : 24_10_11-16_53_47
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-009-027-11 | FUSED_ID : 6359364768418009531
  IC_TEMP :  -61.15 | VDDM : 1122.85 | AUX_INT :   -8.25 | CsaBias :   83.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32124e-03 / 2
  ADC_P0  : -8.25039e-03 ± 2.46218e-02
  ADC_P1  : 8.41645e-03 ± 6.03692e-04
  ADC_P2  : -6.13047e-06 ± 2.92750e-06
  CSA_Chi2/NDF : 1.49972e-04 / 2
  CSA_P0  : 5.70477e-02 ± 8.16823e-03
  CSA_P1  : 9.99210e-03 ± 6.15417e-04
  CSA_P2  : -4.67737e-05 ± 9.37207e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [37]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [24]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2349', '1.800', '0.1567', '1.800', '0.0837', '7.000', '0.7074', 1, 1, 1, 1, 1728658427.3320706]
VI_after__Init : ['1.202', '0.2354', '1.800', '0.1567', '1.801', '0.0786', '7.000', '0.7072', 1, 1, 1, 1, 1728658435.4283228]
VI_at__the_End : ['1.201', '0.4966', '1.800', '0.1370', '1.800', '0.1146', '7.000', '0.7078', 1, 1, 1, 1, 1728658502.8291771]