TEST_NAME : Wafer
TEST_DATE : 24_10_11-17_46_35
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-010-008-02 | FUSED_ID : 6359364768418013314
  IC_TEMP :  -59.34 | VDDM : 1119.85 | AUX_INT :   -8.18 | CsaBias :   85.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47872e-03 / 2
  ADC_P0  : -8.18378e-03 ± 2.60509e-02
  ADC_P1  : 7.87379e-03 ± 5.95001e-04
  ADC_P2  : -5.38751e-06 ± 2.69375e-06
  CSA_Chi2/NDF : 1.12283e-04 / 2
  CSA_P0  : 5.78571e-02 ± 7.06773e-03
  CSA_P1  : 9.35808e-03 ± 5.32503e-04
  CSA_P2  : -4.15226e-05 ± 8.10938e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [11, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [3]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3136', '1.800', '0.1230', '1.800', '0.0968', '7.000', '0.7070', 1, 1, 1, 1, 1728661595.1265447]
VI_after__Init : ['1.202', '0.3138', '1.800', '0.1231', '1.800', '0.0913', '7.000', '0.7069', 1, 1, 1, 1, 1728661603.1178715]
VI_at__the_End : ['1.202', '0.4794', '1.800', '0.1348', '1.800', '0.1151', '7.000', '0.7076', 1, 1, 1, 1, 1728661666.7570229]