TEST_NAME : Wafer
TEST_DATE : 24_10_11-17_49_52
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-010-010-02 | FUSED_ID : 6359364768418013346
  IC_TEMP :  -70.85 | VDDM : 1122.17 | AUX_INT :   -6.86 | CsaBias :   68.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.52830e-04 / 2
  ADC_P0  : -6.86288e-03 ± 1.97427e-02
  ADC_P1  : 8.46538e-03 ± 4.88132e-04
  ADC_P2  : -6.25649e-06 ± 2.38197e-06
  CSA_Chi2/NDF : 1.43182e-04 / 2
  CSA_P0  : 5.75838e-02 ± 7.98116e-03
  CSA_P1  : 9.93751e-03 ± 6.01323e-04
  CSA_P2  : -5.33011e-05 ± 9.15743e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [69, 83, 94, 95, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1506', '1.800', '0.1632', '1.800', '0.0845', '7.000', '0.7069', 1, 1, 1, 1, 1728661792.6155205]
VI_after__Init : ['1.202', '0.1509', '1.800', '0.1632', '1.800', '0.0796', '7.000', '0.7070', 1, 1, 1, 1, 1728661800.7189248]
VI_at__the_End : ['1.202', '0.4687', '1.800', '0.1349', '1.803', '0.1216', '7.000', '0.7076', 1, 1, 1, 1, 1728661868.7648118]