TEST_NAME : Wafer
TEST_DATE : 24_10_11-17_58_06
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-010-015-02 | FUSED_ID : 6359364768418013426
  IC_TEMP :  -62.26 | VDDM : 1126.48 | AUX_INT :   -8.36 | CsaBias :   68.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30365e-03 / 2
  ADC_P0  : -8.36056e-03 ± 2.44737e-02
  ADC_P1  : 8.55939e-03 ± 6.14675e-04
  ADC_P2  : -6.02392e-06 ± 3.05928e-06
  CSA_Chi2/NDF : 1.23611e-04 / 2
  CSA_P0  : 5.99869e-02 ± 7.41568e-03
  CSA_P1  : 1.00290e-02 ± 5.58718e-04
  CSA_P2  : -5.02638e-05 ± 8.50862e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [20]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2088', '1.800', '0.1418', '1.799', '0.0925', '7.000', '0.7067', 1, 1, 1, 1, 1728662286.467846]
VI_after__Init : ['1.202', '0.2092', '1.800', '0.1419', '1.799', '0.0873', '7.000', '0.7069', 1, 1, 1, 1, 1728662294.6332972]
VI_at__the_End : ['1.202', '0.4885', '1.800', '0.1388', '1.804', '0.1170', '7.000', '0.7077', 1, 1, 1, 1, 1728662363.0199435]