TEST_NAME : Wafer
TEST_DATE : 24_10_11-17_59_46
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-010-016-05 | FUSED_ID : 6359364768418013445
  IC_TEMP :  -63.55 | VDDM : 1124.10 | AUX_INT :   -7.67 | CsaBias :   83.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01070e-03 / 2
  ADC_P0  : -7.67281e-03 ± 2.15318e-02
  ADC_P1  : 8.30912e-03 ± 5.29544e-04
  ADC_P2  : -5.39011e-06 ± 2.58481e-06
  CSA_Chi2/NDF : 1.70696e-04 / 2
  CSA_P0  : 5.99752e-02 ± 8.71433e-03
  CSA_P1  : 1.03480e-02 ± 6.56562e-04
  CSA_P2  : -5.44957e-05 ± 9.99866e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [7]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [66]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3634', '1.800', '0.1687', '1.799', '0.0922', '7.000', '0.7070', 1, 1, 1, 1, 1728662386.0472445]
VI_after__Init : ['1.201', '0.3637', '1.799', '0.1689', '1.800', '0.0876', '7.000', '0.7069', 1, 1, 1, 1, 1728662394.2475567]
VI_at__the_End : ['1.201', '0.4932', '1.800', '0.1410', '1.799', '0.1175', '7.000', '0.7081', 1, 1, 1, 1, 1728662462.8003612]