TEST_NAME : Wafer
TEST_DATE : 24_10_11-18_03_04
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-010-018-05 | FUSED_ID : 6359364768418013477
  IC_TEMP :  -69.03 | VDDM : 1122.67 | AUX_INT :   -8.21 | CsaBias :   65.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11594e-03 / 2
  ADC_P0  : -8.21429e-03 ± 2.25867e-02
  ADC_P1  : 8.24234e-03 ± 5.37972e-04
  ADC_P2  : -6.10518e-06 ± 2.53439e-06
  CSA_Chi2/NDF : 1.71832e-04 / 2
  CSA_P0  : 5.84299e-02 ± 8.74328e-03
  CSA_P1  : 9.91521e-03 ± 6.58743e-04
  CSA_P2  : -5.20545e-05 ± 1.00319e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [75, 91]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [43, 51, 59, 84, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4637', '1.800', '0.1066', '1.799', '0.1039', '7.000', '0.7070', 1, 1, 1, 1, 1728662584.098798]
VI_after__Init : ['1.202', '0.4648', '1.800', '0.1067', '1.801', '0.0987', '7.000', '0.7070', 1, 1, 1, 1, 1728662592.8941438]
VI_at__the_End : ['1.202', '0.4747', '1.800', '0.1352', '1.800', '0.1206', '7.000', '0.7073', 1, 1, 1, 1, 1728662659.5384514]