TEST_NAME : Wafer
TEST_DATE : 24_10_11-18_16_16
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-010-026-05 | FUSED_ID : 6359364768418013605
  IC_TEMP :  -69.81 | VDDM : 1129.61 | AUX_INT :   -9.21 | CsaBias :   69.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57944e-03 / 2
  ADC_P0  : -9.21435e-03 ± 2.69780e-02
  ADC_P1  : 8.78581e-03 ± 6.97025e-04
  ADC_P2  : -6.09232e-06 ± 3.58050e-06
  CSA_Chi2/NDF : 2.33021e-04 / 2
  CSA_P0  : 5.75483e-02 ± 1.01817e-02
  CSA_P1  : 1.02998e-02 ± 7.67116e-04
  CSA_P2  : -5.68123e-05 ± 1.16823e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [22, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [71]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3103', '1.800', '0.1611', '1.799', '0.0961', '7.000', '0.7069', 1, 1, 1, 1, 1728663376.0712476]
VI_after__Init : ['1.202', '0.3106', '1.800', '0.1612', '1.800', '0.0912', '7.000', '0.7070', 1, 1, 1, 1, 1728663384.1116576]
VI_at__the_End : ['1.201', '0.4778', '1.800', '0.1357', '1.804', '0.1213', '7.000', '0.7079', 1, 1, 1, 1, 1728663443.5312812]