TEST_NAME : Wafer
TEST_DATE : 24_10_11-18_59_09
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-011-003-15 | FUSED_ID : 6359364768418017343
  IC_TEMP :  -66.79 | VDDM : 1116.04 | AUX_INT :   -7.23 | CsaBias :   67.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.93937e-04 / 2
  ADC_P0  : -7.22968e-03 ± 2.02065e-02
  ADC_P1  : 8.31077e-03 ± 4.89442e-04
  ADC_P2  : -6.05796e-06 ± 2.34102e-06
  CSA_Chi2/NDF : 1.50416e-04 / 2
  CSA_P0  : 5.73889e-02 ± 8.18030e-03
  CSA_P1  : 9.82382e-03 ± 6.16326e-04
  CSA_P2  : -4.74160e-05 ± 9.38592e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [43, 99, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [18, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1371', '1.800', '0.1277', '1.800', '0.0856', '7.000', '0.7065', 1, 1, 1, 1, 1728665949.19364]
VI_after__Init : ['1.202', '0.1371', '1.800', '0.1277', '1.800', '0.0804', '7.000', '0.7068', 1, 1, 1, 1, 1728665957.3160138]
VI_at__the_End : ['1.201', '0.4839', '1.800', '0.1347', '1.808', '0.1189', '7.000', '0.7075', 1, 1, 1, 1, 1728666025.8387408]