TEST_NAME : Wafer
TEST_DATE : 24_10_11-18_36_04
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-011-017-08 | FUSED_ID : 6359364768418017560
  IC_TEMP :  -68.92 | VDDM : 1126.04 | AUX_INT :   -9.25 | CsaBias :   93.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45586e-03 / 2
  ADC_P0  : -9.25327e-03 ± 2.58149e-02
  ADC_P1  : 8.66405e-03 ± 6.39252e-04
  ADC_P2  : -7.01081e-06 ± 3.13376e-06
  CSA_Chi2/NDF : 1.25987e-04 / 2
  CSA_P0  : 6.05263e-02 ± 7.48661e-03
  CSA_P1  : 9.70086e-03 ± 5.64062e-04
  CSA_P2  : -4.80563e-05 ± 8.59000e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [4, 81, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2381', '1.800', '0.1565', '1.800', '0.0923', '7.000', '0.7069', 1, 1, 1, 1, 1728664563.796785]
VI_after__Init : ['1.202', '0.2383', '1.800', '0.1566', '1.800', '0.0870', '7.000', '0.7066', 1, 1, 1, 1, 1728664571.8650157]
VI_at__the_End : ['1.202', '0.4777', '1.800', '0.1388', '1.808', '0.1188', '7.000', '0.7075', 1, 1, 1, 1, 1728664639.9783535]