TEST_NAME : Wafer
TEST_DATE : 24_10_11-18_34_25
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-011-018-08 | FUSED_ID : 6359364768418017576
  IC_TEMP :  -62.84 | VDDM : 1110.10 | AUX_INT :   -8.22 | CsaBias :   82.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31864e-03 / 2
  ADC_P0  : -8.21851e-03 ± 2.45859e-02
  ADC_P1  : 8.28433e-03 ± 5.91226e-04
  ADC_P2  : -5.81602e-06 ± 2.82846e-06
  CSA_Chi2/NDF : 1.13333e-04 / 2
  CSA_P0  : 5.88203e-02 ± 7.10070e-03
  CSA_P1  : 9.65182e-03 ± 5.34986e-04
  CSA_P2  : -4.64505e-05 ± 8.14721e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2963', '1.800', '0.1744', '1.799', '0.0925', '7.000', '0.7075', 1, 1, 1, 1, 1728664464.8005202]
VI_after__Init : ['1.202', '0.2960', '1.800', '0.1745', '1.799', '0.0845', '7.000', '0.7069', 1, 1, 1, 1, 1728664473.4728258]
VI_at__the_End : ['1.201', '0.4760', '1.800', '0.1351', '1.806', '0.1176', '7.000', '0.7073', 1, 1, 1, 1, 1728664540.8636222]