TEST_NAME : Wafer
TEST_DATE : 24_10_11-19_02_27
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-012-002-07 | FUSED_ID : 6359364768418021415
  IC_TEMP :  -70.21 | VDDM : 1125.94 | AUX_INT :   -8.27 | CsaBias :   69.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19716e-03 / 2
  ADC_P0  : -8.26836e-03 ± 2.33987e-02
  ADC_P1  : 8.74136e-03 ± 5.89611e-04
  ADC_P2  : -6.97729e-06 ± 2.93643e-06
  CSA_Chi2/NDF : 1.84274e-04 / 2
  CSA_P0  : 5.44224e-02 ± 9.05429e-03
  CSA_P1  : 9.49898e-03 ± 6.82175e-04
  CSA_P2  : -4.47571e-05 ± 1.03887e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 40, 53, 104, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [78]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2418', '1.800', '0.1567', '1.800', '0.0873', '7.000', '0.7065', 1, 1, 1, 1, 1728666147.0872762]
VI_after__Init : ['1.202', '0.2422', '1.800', '0.1567', '1.800', '0.0824', '7.000', '0.7065', 1, 1, 1, 1, 1728666155.0667062]
VI_at__the_End : ['1.202', '0.4706', '1.800', '0.1342', '1.800', '0.1170', '7.000', '0.7079', 1, 1, 1, 1, 1728666214.6120746]