TEST_NAME : Wafer
TEST_DATE : 24_10_11-20_11_43
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-013-010-10 | FUSED_ID : 6359364768418025642
  IC_TEMP :  -61.66 | VDDM : 1119.38 | AUX_INT :   -7.85 | CsaBias :   74.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08582e-03 / 2
  ADC_P0  : -7.84818e-03 ± 2.22730e-02
  ADC_P1  : 8.25912e-03 ± 5.28878e-04
  ADC_P2  : -6.36562e-06 ± 2.47819e-06
  CSA_Chi2/NDF : 1.21288e-04 / 2
  CSA_P0  : 5.72288e-02 ± 7.34568e-03
  CSA_P1  : 9.55499e-03 ± 5.53444e-04
  CSA_P2  : -4.41265e-05 ± 8.42830e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [24, 40]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [20, 64]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1596', '1.800', '0.1271', '1.800', '0.0926', '7.000', '0.7086', 1, 1, 1, 1, 1728670303.334002]
VI_after__Init : ['1.202', '0.1596', '1.800', '0.1271', '1.800', '0.0857', '7.000', '0.7080', 1, 1, 1, 1, 1728670311.427346]
VI_at__the_End : ['1.202', '0.4804', '1.800', '0.1349', '1.800', '0.1191', '7.000', '0.7085', 1, 1, 1, 1, 1728670377.8582058]