TEST_NAME : Wafer
TEST_DATE : 24_10_11-20_10_05
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-013-011-10 | FUSED_ID : 6359364768418025658
  IC_TEMP :  -65.44 | VDDM : 1104.52 | AUX_INT :   -7.21 | CsaBias :   81.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08083e-03 / 2
  ADC_P0  : -7.21413e-03 ± 2.22218e-02
  ADC_P1  : 8.09081e-03 ± 5.18899e-04
  ADC_P2  : -5.92456e-06 ± 2.39769e-06
  CSA_Chi2/NDF : 1.35287e-04 / 2
  CSA_P0  : 5.79793e-02 ± 7.75800e-03
  CSA_P1  : 9.46014e-03 ± 5.84510e-04
  CSA_P2  : -4.52481e-05 ± 8.90139e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [4]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2093', '1.800', '0.1474', '1.800', '0.0966', '7.000', '0.7079', 1, 1, 1, 1, 1728670205.1574953]
VI_after__Init : ['1.202', '0.2093', '1.800', '0.1474', '1.800', '0.0911', '7.000', '0.7082', 1, 1, 1, 1, 1728670213.2999501]
VI_at__the_End : ['1.202', '0.4709', '1.800', '0.1322', '1.799', '0.1189', '7.000', '0.7086', 1, 1, 1, 1, 1728670280.5717409]