TEST_NAME : Wafer
TEST_DATE : 24_10_11-19_48_40
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-013-024-13 | FUSED_ID : 6359364768418025869
  IC_TEMP :  -58.58 | VDDM : 1117.52 | AUX_INT :   -7.34 | CsaBias :   74.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00542e-03 / 2
  ADC_P0  : -7.33996e-03 ± 2.14551e-02
  ADC_P1  : 8.19895e-03 ± 5.13710e-04
  ADC_P2  : -5.80960e-06 ± 2.43108e-06
  CSA_Chi2/NDF : 1.41111e-04 / 2
  CSA_P0  : 5.68053e-02 ± 7.92325e-03
  CSA_P1  : 9.78785e-03 ± 5.96960e-04
  CSA_P2  : -4.45644e-05 ± 9.09099e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2774', '1.800', '0.1250', '1.800', '0.0884', '7.000', '0.7074', 1, 1, 1, 1, 1728668920.2235124]
VI_after__Init : ['1.202', '0.2774', '1.800', '0.1250', '1.800', '0.0841', '7.000', '0.7076', 1, 1, 1, 1, 1728668928.1588655]
VI_at__the_End : ['1.201', '0.4924', '1.800', '0.1351', '1.800', '0.1153', '7.000', '0.7084', 1, 1, 1, 1, 1728668995.6139615]