TEST_NAME : Wafer
TEST_DATE : 24_10_11-19_45_21
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-013-026-13 | FUSED_ID : 6359364768418025901
  IC_TEMP :  -59.09 | VDDM : 1122.35 | AUX_INT :   -7.87 | CsaBias :   83.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07147e-03 / 2
  ADC_P0  : -7.86533e-03 ± 2.21391e-02
  ADC_P1  : 8.39436e-03 ± 5.38074e-04
  ADC_P2  : -6.30765e-06 ± 2.58537e-06
  CSA_Chi2/NDF : 9.25006e-05 / 2
  CSA_P0  : 5.80333e-02 ± 6.41497e-03
  CSA_P1  : 9.25837e-03 ± 4.83322e-04
  CSA_P2  : -3.72233e-05 ± 7.36042e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [42, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1995', '1.800', '0.1335', '1.800', '0.0879', '7.000', '0.7083', 1, 1, 1, 1, 1728668720.8608503]
VI_after__Init : ['1.202', '0.1995', '1.800', '0.1332', '1.800', '0.0818', '7.000', '0.7074', 1, 1, 1, 1, 1728668728.8051915]
VI_at__the_End : ['1.202', '0.4916', '1.800', '0.1363', '1.800', '0.1131', '7.000', '0.7082', 1, 1, 1, 1, 1728668796.5984013]