TEST_NAME : Wafer
TEST_DATE : 24_10_11-20_26_33
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-014-004-04 | FUSED_ID : 6359364768418029636
  IC_TEMP :  -66.10 | VDDM : 1113.84 | AUX_INT :   -8.19 | CsaBias :   66.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23438e-03 / 2
  ADC_P0  : -8.19329e-03 ± 2.37196e-02
  ADC_P1  : 8.31914e-03 ± 5.59067e-04
  ADC_P2  : -6.70909e-06 ± 2.60993e-06
  CSA_Chi2/NDF : 1.42310e-04 / 2
  CSA_P0  : 5.53970e-02 ± 7.95683e-03
  CSA_P1  : 9.77308e-03 ± 5.99490e-04
  CSA_P2  : -4.70944e-05 ± 9.12952e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [6, 19, 27, 80, 97, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [32, 66]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4075', '1.800', '0.1276', '1.800', '0.0925', '7.000', '0.7073', 1, 1, 1, 1, 1728671193.1002579]
VI_after__Init : ['1.202', '0.4082', '1.800', '0.1277', '1.800', '0.0883', '7.000', '0.7073', 1, 1, 1, 1, 1728671201.8266277]
VI_at__the_End : ['1.202', '0.4793', '1.800', '0.1316', '1.800', '0.1149', '7.000', '0.7079', 1, 1, 1, 1, 1728671269.6433456]