TEST_NAME : Wafer
TEST_DATE : 24_10_11-20_43_04
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-014-014-04 | FUSED_ID : 6359364768418029796
  IC_TEMP :  -60.71 | VDDM : 1124.50 | AUX_INT :   -7.85 | CsaBias :   76.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43096e-03 / 2
  ADC_P0  : -7.84957e-03 ± 2.55965e-02
  ADC_P1  : 8.46307e-03 ± 6.22305e-04
  ADC_P2  : -6.66727e-06 ± 2.98730e-06
  CSA_Chi2/NDF : 1.32764e-04 / 2
  CSA_P0  : 5.82981e-02 ± 7.68533e-03
  CSA_P1  : 9.65787e-03 ± 5.79034e-04
  CSA_P2  : -4.52525e-05 ± 8.81801e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3005', '1.800', '0.1533', '1.800', '0.0936', '7.000', '0.7076', 1, 1, 1, 1, 1728672183.7505875]
VI_after__Init : ['1.202', '0.3005', '1.800', '0.1534', '1.800', '0.0873', '7.000', '0.7070', 1, 1, 1, 1, 1728672191.8338573]
VI_at__the_End : ['1.202', '0.4861', '1.800', '0.1374', '1.802', '0.1161', '7.000', '0.7077', 1, 1, 1, 1, 1728672252.5541985]