TEST_NAME : Wafer
TEST_DATE : 24_10_11-21_39_08
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-015-004-09 | FUSED_ID : 6359364768418033737
  IC_TEMP :  -63.53 | VDDM : 1124.50 | AUX_INT :   -7.84 | CsaBias :   78.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10952e-03 / 2
  ADC_P0  : -7.83558e-03 ± 2.25509e-02
  ADC_P1  : 8.67802e-03 ± 5.73298e-04
  ADC_P2  : -6.31715e-06 ± 2.88545e-06
  CSA_Chi2/NDF : 1.92356e-04 / 2
  CSA_P0  : 5.72488e-02 ± 9.25072e-03
  CSA_P1  : 9.97756e-03 ± 6.96975e-04
  CSA_P2  : -4.90237e-05 ± 1.06141e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3344', '1.799', '0.1123', '1.800', '0.0928', '7.000', '0.7068', 1, 1, 1, 1, 1728675548.1597583]
VI_after__Init : ['1.201', '0.3345', '1.800', '0.1123', '1.800', '0.0872', '7.000', '0.7064', 1, 1, 1, 1, 1728675556.3661418]
VI_at__the_End : ['1.202', '0.4872', '1.800', '0.1379', '1.800', '0.1161', '7.000', '0.7075', 1, 1, 1, 1, 1728675615.8996649]