TEST_NAME : Wafer
TEST_DATE : 24_10_11-21_27_34
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-015-011-09 | FUSED_ID : 6359364768418033849
  IC_TEMP :  -68.25 | VDDM : 1129.34 | AUX_INT :   -8.39 | CsaBias :   76.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03129e-03 / 2
  ADC_P0  : -8.38556e-03 ± 2.16836e-02
  ADC_P1  : 8.54207e-03 ± 5.32007e-04
  ADC_P2  : -6.67214e-06 ± 2.58618e-06
  CSA_Chi2/NDF : 1.55126e-04 / 2
  CSA_P0  : 5.87612e-02 ± 8.30738e-03
  CSA_P1  : 1.00345e-02 ± 6.25901e-04
  CSA_P2  : -5.09201e-05 ± 9.53173e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [33]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2467', '1.800', '0.1826', '1.800', '0.0979', '7.000', '0.7072', 1, 1, 1, 1, 1728674854.2001765]
VI_after__Init : ['1.201', '0.2467', '1.800', '0.1827', '1.800', '0.0910', '7.000', '0.7065', 1, 1, 1, 1, 1728674862.210546]
VI_at__the_End : ['1.202', '0.4847', '1.799', '0.1376', '1.801', '0.1198', '7.000', '0.7073', 1, 1, 1, 1, 1728674921.1651773]