TEST_NAME : Wafer
TEST_DATE : 24_10_11-21_25_55
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-015-012-09 | FUSED_ID : 6359364768418033865
  IC_TEMP :  -59.37 | VDDM : 1124.97 | AUX_INT :  -27.62 | CsaBias :   65.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.82755e-03 / 2
  ADC_P0  : -2.76154e-02 ± 2.99106e-02
  ADC_P1  : 8.52905e-03 ± 6.93752e-04
  ADC_P2  : -7.56530e-06 ± 3.17587e-06
  CSA_Chi2/NDF : 9.21322e-05 / 2
  CSA_P0  : 5.50547e-02 ± 6.40218e-03
  CSA_P1  : 9.27174e-03 ± 4.82358e-04
  CSA_P2  : -3.95578e-05 ± 7.34574e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [16]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2981', '1.800', '0.1321', '1.800', '0.0865', '7.000', '0.7065', 1, 1, 1, 1, 1728674754.580001]
VI_after__Init : ['1.202', '0.2983', '1.800', '0.1322', '1.800', '0.0814', '7.000', '0.7067', 1, 1, 1, 1, 1728674763.3513398]
VI_at__the_End : ['1.201', '0.4777', '1.804', '0.1327', '1.800', '0.1148', '7.000', '0.7073', 1, 1, 1, 1, 1728674831.176058]