TEST_NAME : Wafer
TEST_DATE : 24_10_11-22_49_57
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-018-017-05 | FUSED_ID : 6359364768418046229
  IC_TEMP :  -60.30 | VDDM : 1121.20 | AUX_INT :   -7.66 | CsaBias :   78.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17143e-03 / 2
  ADC_P0  : -7.66311e-03 ± 2.31943e-02
  ADC_P1  : 7.91026e-03 ± 5.41089e-04
  ADC_P2  : -5.09751e-06 ± 2.49653e-06
  CSA_Chi2/NDF : 1.41351e-04 / 2
  CSA_P0  : 5.63028e-02 ± 7.92996e-03
  CSA_P1  : 9.68541e-03 ± 5.97466e-04
  CSA_P2  : -4.39951e-05 ± 9.09869e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [28]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3178', '1.800', '0.1496', '1.800', '0.0954', '7.000', '0.7075', 1, 1, 1, 1, 1728679797.0135953]
VI_after__Init : ['1.202', '0.3179', '1.800', '0.1496', '1.800', '0.0901', '7.000', '0.7074', 1, 1, 1, 1, 1728679805.0169864]
VI_at__the_End : ['1.202', '0.4878', '1.800', '0.1362', '1.800', '0.1170', '7.000', '0.7080', 1, 1, 1, 1, 1728679873.4067671]