TEST_NAME : Wafer
TEST_DATE : 24_12_10-08_16_31
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-002-015-14 | FUSED_ID : 6359364768457826558
  IC_TEMP :  -82.45 | VDDM : 1102.60 | AUX_INT :   -8.59 | CsaBias :   45.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28653e-03 / 2
  ADC_P0  : -8.58565e-03 ± 2.42531e-02
  ADC_P1  : 9.13030e-03 ± 6.34493e-04
  ADC_P2  : -7.81330e-06 ± 3.27970e-06
  CSA_Chi2/NDF : 1.90167e-04 / 2
  CSA_P0  : 5.61278e-02 ± 9.19793e-03
  CSA_P1  : 9.91650e-03 ± 6.92998e-04
  CSA_P2  : -5.95740e-05 ± 1.05535e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [75]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3987', '1.800', '0.1641', '1.799', '0.0993', '7.000', '0.7064', 1, 1, 1, 1, 1733814990.4869292]
VI_after__Init : ['1.201', '0.4009', '1.800', '0.1656', '1.800', '0.0935', '7.000', '0.7064', 1, 1, 1, 1, 1733814999.0372078]
VI_at__the_End : ['1.201', '0.4368', '1.800', '0.1290', '1.799', '0.1170', '7.000', '0.7071', 1, 1, 1, 1, 1733815065.3826022]