TEST_NAME : Wafer
TEST_DATE : 24_12_10-08_50_46
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-003-007-03 | FUSED_ID : 6359364768457830515
  IC_TEMP :  -91.19 | VDDM : 1115.02 | AUX_INT :  -11.42 | CsaBias :   36.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.87052e-03 / 2
  ADC_P0  : -1.14155e-02 ± 2.92150e-02
  ADC_P1  : 9.55879e-03 ± 7.73404e-04
  ADC_P2  : -9.38386e-06 ± 4.06738e-06
  CSA_Chi2/NDF : 1.79970e-04 / 2
  CSA_P0  : 5.73989e-02 ± 8.94792e-03
  CSA_P1  : 1.05485e-02 ± 6.74161e-04
  CSA_P2  : -6.77611e-05 ± 1.02667e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [20]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [31, 80, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2884', '1.800', '0.1452', '1.800', '0.0983', '7.000', '0.7063', 1, 1, 1, 1, 1733817046.3097327]
VI_after__Init : ['1.201', '0.2887', '1.800', '0.1454', '1.799', '0.0921', '7.000', '0.7062', 1, 1, 1, 1, 1733817054.511052]
VI_at__the_End : ['1.201', '0.4484', '1.800', '0.1313', '1.800', '0.1198', '7.000', '0.7069', 1, 1, 1, 1, 1733817113.5032585]