TEST_NAME : Wafer
TEST_DATE : 24_12_10-08_45_38
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-003-010-03 | FUSED_ID : 6359364768457830563
  IC_TEMP :  -88.62 | VDDM : 1114.07 | AUX_INT :  -12.44 | CsaBias :   43.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.19697e-03 / 2
  ADC_P0  : -1.24423e-02 ± 3.17366e-02
  ADC_P1  : 9.38108e-03 ± 8.37960e-04
  ADC_P2  : -8.07255e-06 ± 4.43473e-06
  CSA_Chi2/NDF : 1.45600e-04 / 2
  CSA_P0  : 5.72330e-02 ± 8.04827e-03
  CSA_P1  : 1.07839e-02 ± 6.06379e-04
  CSA_P2  : -7.48449e-05 ± 9.23444e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [41]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [20]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3292', '1.800', '0.1484', '1.799', '0.1002', '7.000', '0.7067', 1, 1, 1, 1, 1733816737.492856]
VI_after__Init : ['1.201', '0.3309', '1.800', '0.1487', '1.799', '0.0945', '7.000', '0.7066', 1, 1, 1, 1, 1733816746.3480728]
VI_at__the_End : ['1.201', '0.4370', '1.800', '0.1332', '1.800', '0.1197', '7.000', '0.7073', 1, 1, 1, 1, 1733816809.7619243]