TEST_NAME : Wafer
TEST_DATE : 24_12_10-08_37_03
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-003-015-03 | FUSED_ID : 6359364768457830643
  IC_TEMP :  -77.80 | VDDM : 1112.96 | AUX_INT :  -13.67 | CsaBias :   48.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.91381e-03 / 2
  ADC_P0  : -1.36742e-02 ± 3.67027e-02
  ADC_P1  : 8.92802e-03 ± 9.40145e-04
  ADC_P2  : -6.29032e-06 ± 4.86340e-06
  CSA_Chi2/NDF : 1.57756e-04 / 2
  CSA_P0  : 5.67474e-02 ± 8.37752e-03
  CSA_P1  : 1.07145e-02 ± 6.31186e-04
  CSA_P2  : -7.17130e-05 ± 9.61221e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.0874', '1.800', '0.1022', '1.800', '0.0788', '7.000', '0.7070', 1, 1, 1, 1, 1733816223.4289532]
VI_after__Init : ['1.201', '0.0873', '1.800', '0.1019', '1.800', '0.0737', '7.000', '0.7069', 1, 1, 1, 1, 1733816231.5062213]
VI_at__the_End : ['1.201', '0.4414', '1.800', '0.1293', '1.800', '0.1170', '7.000', '0.7079', 1, 1, 1, 1, 1733816295.608569]