TEST_NAME : Wafer
TEST_DATE : 24_12_10-08_33_37
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-003-017-04 | FUSED_ID : 6359364768457830676
  IC_TEMP :  -84.12 | VDDM : 1118.91 | AUX_INT :  -10.97 | CsaBias :   51.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.01455e-03 / 2
  ADC_P0  : -1.09740e-02 ± 3.04444e-02
  ADC_P1  : 8.97983e-03 ± 7.80601e-04
  ADC_P2  : -7.20346e-06 ± 3.98982e-06
  CSA_Chi2/NDF : 1.74770e-04 / 2
  CSA_P0  : 5.58766e-02 ± 8.81771e-03
  CSA_P1  : 9.69400e-03 ± 6.64351e-04
  CSA_P2  : -5.72262e-05 ± 1.01173e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [74, 85, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3288', '1.800', '0.1163', '1.800', '0.0972', '7.000', '0.7069', 1, 1, 1, 1, 1733816016.5313265]
VI_after__Init : ['1.201', '0.3299', '1.800', '0.1165', '1.800', '0.0915', '7.000', '0.7072', 1, 1, 1, 1, 1733816025.2326345]
VI_at__the_End : ['1.201', '0.4350', '1.800', '0.1314', '1.800', '0.1180', '7.000', '0.7075', 1, 1, 1, 1, 1733816087.050042]