TEST_NAME : Wafer
TEST_DATE : 24_12_10-08_30_10
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-003-019-04 | FUSED_ID : 6359364768457830708
  IC_TEMP :  -95.05 | VDDM : 1118.62 | AUX_INT :  -10.65 | CsaBias :   54.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.03113e-03 / 2
  ADC_P0  : -1.06529e-02 ± 3.05295e-02
  ADC_P1  : 9.31600e-03 ± 8.08141e-04
  ADC_P2  : -7.83309e-06 ± 4.27347e-06
  CSA_Chi2/NDF : 1.60968e-04 / 2
  CSA_P0  : 5.73407e-02 ± 8.46237e-03
  CSA_P1  : 1.08135e-02 ± 6.37579e-04
  CSA_P2  : -7.63734e-05 ± 9.70957e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [0, 18]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3438', '1.800', '0.1046', '1.800', '0.0957', '7.000', '0.7069', 1, 1, 1, 1, 1733815810.5175688]
VI_after__Init : ['1.202', '0.3460', '1.800', '0.1054', '1.800', '0.0902', '7.000', '0.7068', 1, 1, 1, 1, 1733815818.580892]
VI_at__the_End : ['1.201', '0.4323', '1.800', '0.1300', '1.800', '0.1183', '7.000', '0.7076', 1, 1, 1, 1, 1733815885.3470528]