TEST_NAME : Wafer
TEST_DATE : 24_12_10-08_26_45
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-003-021-04 | FUSED_ID : 6359364768457830740
  IC_TEMP :  -88.73 | VDDM : 1120.70 | AUX_INT :  -10.56 | CsaBias :   53.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.81431e-03 / 2
  ADC_P0  : -1.05563e-02 ± 2.88474e-02
  ADC_P1  : 9.13470e-03 ± 7.46352e-04
  ADC_P2  : -7.88390e-06 ± 3.83598e-06
  CSA_Chi2/NDF : 2.00127e-04 / 2
  CSA_P0  : 5.66231e-02 ± 9.43573e-03
  CSA_P1  : 1.04759e-02 ± 7.10914e-04
  CSA_P2  : -6.76142e-05 ± 1.08264e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [0, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [15]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2537', '1.800', '0.1523', '1.800', '0.0969', '7.000', '0.7067', 1, 1, 1, 1, 1733815604.7447155]
VI_after__Init : ['1.202', '0.2544', '1.800', '0.1528', '1.800', '0.0912', '7.000', '0.7067', 1, 1, 1, 1, 1733815612.7450442]
VI_at__the_End : ['1.201', '0.4440', '1.800', '0.1303', '1.800', '0.1208', '7.000', '0.7075', 1, 1, 1, 1, 1733815676.296417]