TEST_NAME : Wafer
TEST_DATE : 24_12_10-08_25_03
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-003-022-04 | FUSED_ID : 6359364768457830756
  IC_TEMP :  -85.79 | VDDM : 1119.49 | AUX_INT :  -10.50 | CsaBias :   52.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65415e-03 / 2
  ADC_P0  : -1.05016e-02 ± 2.75005e-02
  ADC_P1  : 9.09082e-03 ± 7.04865e-04
  ADC_P2  : -7.97997e-06 ± 3.58727e-06
  CSA_Chi2/NDF : 1.74847e-04 / 2
  CSA_P0  : 5.81592e-02 ± 8.81965e-03
  CSA_P1  : 1.04464e-02 ± 6.64497e-04
  CSA_P2  : -6.44339e-05 ± 1.01195e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [93, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [15]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3542', '1.800', '0.1495', '1.800', '0.1040', '6.999', '0.7067', 1, 1, 1, 1, 1733815502.7951994]
VI_after__Init : ['1.202', '0.3551', '1.800', '0.1505', '1.800', '0.0983', '6.999', '0.7069', 1, 1, 1, 1, 1733815510.8975394]
VI_at__the_End : ['1.202', '0.4551', '1.800', '0.1309', '1.800', '0.1193', '7.000', '0.7074', 1, 1, 1, 1, 1733815578.9546437]