TEST_NAME : Wafer
TEST_DATE : 24_12_10-08_57_37
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-004-009-11 | FUSED_ID : 6359364768457834651
  IC_TEMP :  -80.33 | VDDM : 1108.03 | AUX_INT :  -11.58 | CsaBias :   50.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.96411e-03 / 2
  ADC_P0  : -1.15824e-02 ± 3.00434e-02
  ADC_P1  : 8.91051e-03 ± 7.70803e-04
  ADC_P2  : -6.52356e-06 ± 3.97032e-06
  CSA_Chi2/NDF : 1.79308e-04 / 2
  CSA_P0  : 5.63354e-02 ± 8.93145e-03
  CSA_P1  : 1.02779e-02 ± 6.72920e-04
  CSA_P2  : -6.69349e-05 ± 1.02478e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [44, 47]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3142', '1.800', '0.1390', '1.800', '0.0953', '7.000', '0.7065', 1, 1, 1, 1, 1733817457.154193]
VI_after__Init : ['1.201', '0.3152', '1.800', '0.1392', '1.800', '0.0897', '7.000', '0.7066', 1, 1, 1, 1, 1733817465.2166448]
VI_at__the_End : ['1.201', '0.4345', '1.800', '0.1314', '1.800', '0.1181', '7.000', '0.7074', 1, 1, 1, 1, 1733817529.7516193]