TEST_NAME : Wafer
TEST_DATE : 24_12_10-09_13_04
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-004-018-12 | FUSED_ID : 6359364768457834796
  IC_TEMP :  -87.20 | VDDM : 1113.71 | AUX_INT :  -10.12 | CsaBias :   43.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53413e-03 / 2
  ADC_P0  : -1.01194e-02 ± 2.65231e-02
  ADC_P1  : 9.00218e-03 ± 6.88248e-04
  ADC_P2  : -6.96298e-06 ± 3.56185e-06
  CSA_Chi2/NDF : 1.22942e-04 / 2
  CSA_P0  : 5.80788e-02 ± 7.39558e-03
  CSA_P1  : 1.06428e-02 ± 5.57204e-04
  CSA_P2  : -7.47773e-05 ± 8.48555e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [13]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4037', '1.800', '0.1230', '1.800', '0.0998', '7.000', '0.7070', 1, 1, 1, 1, 1733818384.2349575]
VI_after__Init : ['1.201', '0.4074', '1.800', '0.1233', '1.799', '0.0947', '7.000', '0.7072', 1, 1, 1, 1, 1733818392.321271]
VI_at__the_End : ['1.201', '0.4282', '1.800', '0.1304', '1.800', '0.1183', '7.000', '0.7077', 1, 1, 1, 1, 1733818452.281759]