TEST_NAME : Wafer
TEST_DATE : 24_12_10-09_21_39
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-004-023-12 | FUSED_ID : 6359364768457834876
  IC_TEMP :  -81.16 | VDDM : 1124.99 | AUX_INT :   -7.98 | CsaBias :   51.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10091e-03 / 2
  ADC_P0  : -7.97799e-03 ± 2.24556e-02
  ADC_P1  : 8.52167e-03 ± 5.58944e-04
  ADC_P2  : -6.16032e-06 ± 2.75572e-06
  CSA_Chi2/NDF : 1.89622e-04 / 2
  CSA_P0  : 5.71364e-02 ± 9.18474e-03
  CSA_P1  : 1.03370e-02 ± 6.92004e-04
  CSA_P2  : -6.27115e-05 ± 1.05384e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3732', '1.800', '0.1162', '1.800', '0.0960', '7.000', '0.7069', 1, 1, 1, 1, 1733818898.9048126]
VI_after__Init : ['1.202', '0.3737', '1.800', '0.1170', '1.800', '0.0900', '7.000', '0.7069', 1, 1, 1, 1, 1733818906.935176]
VI_at__the_End : ['1.201', '0.4553', '1.800', '0.1339', '1.800', '0.1180', '7.000', '0.7075', 1, 1, 1, 1, 1733818971.8882322]