TEST_NAME : Wafer
TEST_DATE : 24_12_10-09_50_48
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-005-009-06 | FUSED_ID : 6359364768457838742
  IC_TEMP :  -76.04 | VDDM : 1112.87 | AUX_INT :   -9.25 | CsaBias :   51.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45586e-03 / 2
  ADC_P0  : -9.25327e-03 ± 2.58149e-02
  ADC_P1  : 8.66405e-03 ± 6.39252e-04
  ADC_P2  : -7.01081e-06 ± 3.13376e-06
  CSA_Chi2/NDF : 1.65431e-04 / 2
  CSA_P0  : 5.73571e-02 ± 8.57888e-03
  CSA_P1  : 9.83853e-03 ± 6.46357e-04
  CSA_P2  : -5.72107e-05 ± 9.84325e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [53]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3935', '1.800', '0.1439', '1.800', '0.0957', '7.000', '0.7067', 1, 1, 1, 1, 1733820647.4819572]
VI_after__Init : ['1.202', '0.3960', '1.800', '0.1448', '1.800', '0.0898', '7.000', '0.7071', 1, 1, 1, 1, 1733820656.3261936]
VI_at__the_End : ['1.202', '0.4457', '1.800', '0.1296', '1.800', '0.1150', '7.000', '0.7077', 1, 1, 1, 1, 1733820716.1736178]