TEST_NAME : Wafer
TEST_DATE : 24_12_10-09_43_57
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-005-013-06 | FUSED_ID : 6359364768457838806
  IC_TEMP :  -79.74 | VDDM : 1108.07 | AUX_INT :  -10.86 | CsaBias :   50.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.83083e-03 / 2
  ADC_P0  : -1.08552e-02 ± 2.89581e-02
  ADC_P1  : 8.78382e-03 ± 7.17979e-04
  ADC_P2  : -7.35941e-06 ± 3.53913e-06
  CSA_Chi2/NDF : 1.78604e-04 / 2
  CSA_P0  : 5.59703e-02 ± 8.91390e-03
  CSA_P1  : 9.59885e-03 ± 6.71598e-04
  CSA_P2  : -5.70725e-05 ± 1.02276e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1862', '1.800', '0.1660', '1.800', '0.0895', '7.000', '0.7067', 1, 1, 1, 1, 1733820237.2381458]
VI_after__Init : ['1.202', '0.1867', '1.800', '0.1663', '1.800', '0.0838', '7.000', '0.7069', 1, 1, 1, 1, 1733820245.3164823]
VI_at__the_End : ['1.202', '0.4258', '1.800', '0.1285', '1.800', '0.1162', '7.000', '0.7076', 1, 1, 1, 1, 1733820311.4565778]