TEST_NAME : Wafer
TEST_DATE : 24_12_10-09_33_40
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-005-019-01 | FUSED_ID : 6359364768457838897
  IC_TEMP :  -83.00 | VDDM : 1114.05 | AUX_INT :  -10.82 | CsaBias :   52.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80304e-03 / 2
  ADC_P0  : -1.08154e-02 ± 2.87767e-02
  ADC_P1  : 9.10429e-03 ± 7.49470e-04
  ADC_P2  : -7.27867e-06 ± 3.89784e-06
  CSA_Chi2/NDF : 1.75052e-04 / 2
  CSA_P0  : 5.66972e-02 ± 8.82483e-03
  CSA_P1  : 1.00234e-02 ± 6.64887e-04
  CSA_P2  : -6.37910e-05 ± 1.01254e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [35, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4239', '1.800', '0.1609', '1.800', '0.0982', '7.000', '0.7063', 1, 1, 1, 1, 1733819620.1870096]
VI_after__Init : ['1.201', '0.4281', '1.800', '0.1617', '1.799', '0.0931', '7.000', '0.7064', 1, 1, 1, 1, 1733819627.7044797]
VI_at__the_End : ['1.201', '0.4305', '1.800', '0.1328', '1.800', '0.1160', '7.000', '0.7071', 1, 1, 1, 1, 1733819693.1496696]