TEST_NAME : Wafer
TEST_DATE : 24_12_10-10_08_01
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-006-007-08 | FUSED_ID : 6359364768457842808
  IC_TEMP :  -77.16 | VDDM : 1112.00 | AUX_INT :  -11.16 | CsaBias :   58.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85920e-03 / 2
  ADC_P0  : -1.11596e-02 ± 2.91910e-02
  ADC_P1  : 8.77917e-03 ± 7.26031e-04
  ADC_P2  : -7.12586e-06 ± 3.59907e-06
  CSA_Chi2/NDF : 1.98975e-04 / 2
  CSA_P0  : 5.48585e-02 ± 9.40852e-03
  CSA_P1  : 9.92107e-03 ± 7.08864e-04
  CSA_P2  : -5.90549e-05 ± 1.07952e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1988', '1.800', '0.1465', '1.800', '0.0881', '7.000', '0.7079', 1, 1, 1, 1, 1733821680.690254]
VI_after__Init : ['1.202', '0.1992', '1.800', '0.1464', '1.800', '0.0806', '7.000', '0.7072', 1, 1, 1, 1, 1733821688.734484]
VI_at__the_End : ['1.202', '0.4404', '1.800', '0.1318', '1.799', '0.1153', '7.000', '0.7076', 1, 1, 1, 1, 1733821752.5027032]