TEST_NAME : Wafer
TEST_DATE : 24_12_10-10_13_10
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-006-010-08 | FUSED_ID : 6359364768457842856
  IC_TEMP :  -76.13 | VDDM : 1120.90 | AUX_INT :  -11.51 | CsaBias :   51.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.13821e-03 / 2
  ADC_P0  : -1.15081e-02 ± 3.13301e-02
  ADC_P1  : 9.04892e-03 ± 7.96250e-04
  ADC_P2  : -7.90212e-06 ± 4.02621e-06
  CSA_Chi2/NDF : 1.69603e-04 / 2
  CSA_P0  : 5.79020e-02 ± 8.68639e-03
  CSA_P1  : 1.00320e-02 ± 6.54457e-04
  CSA_P2  : -5.97903e-05 ± 9.96661e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1490', '1.800', '0.1290', '1.800', '0.0844', '7.000', '0.7066', 1, 1, 1, 1, 1733821990.0164135]
VI_after__Init : ['1.202', '0.1490', '1.800', '0.1289', '1.800', '0.0786', '7.000', '0.7069', 1, 1, 1, 1, 1733821998.180851]
VI_at__the_End : ['1.202', '0.4482', '1.800', '0.1325', '1.800', '0.1151', '7.000', '0.7074', 1, 1, 1, 1, 1733822061.642993]