TEST_NAME : Wafer
TEST_DATE : 24_12_10-10_25_09
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-006-017-15 | FUSED_ID : 6359364768457842975
  IC_TEMP :  -77.46 | VDDM : 1124.10 | AUX_INT :   -8.90 | CsaBias :   55.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26761e-03 / 2
  ADC_P0  : -8.89840e-03 ± 2.40990e-02
  ADC_P1  : 9.28703e-03 ± 6.49107e-04
  ADC_P2  : -7.42330e-06 ± 3.47072e-06
  CSA_Chi2/NDF : 1.54325e-04 / 2
  CSA_P0  : 6.09332e-02 ± 8.28592e-03
  CSA_P1  : 1.07011e-02 ± 6.24284e-04
  CSA_P2  : -6.95279e-05 ± 9.50711e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [20]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1916', '1.800', '0.1570', '1.799', '0.0929', '7.000', '0.7063', 1, 1, 1, 1, 1733822708.7295902]
VI_after__Init : ['1.202', '0.1918', '1.800', '0.1568', '1.800', '0.0880', '7.000', '0.7064', 1, 1, 1, 1, 1733822716.7500534]
VI_at__the_End : ['1.202', '0.4543', '1.800', '0.1356', '1.800', '0.1150', '7.000', '0.7071', 1, 1, 1, 1, 1733822777.1641831]