TEST_NAME : Wafer
TEST_DATE : 24_12_10-10_38_51
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-006-025-15 | FUSED_ID : 6359364768457843103
  IC_TEMP :  -77.78 | VDDM : 1117.97 | AUX_INT :   -8.11 | CsaBias :   45.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00997e-03 / 2
  ADC_P0  : -8.11325e-03 ± 2.14856e-02
  ADC_P1  : 9.01682e-03 ± 5.63841e-04
  ADC_P2  : -6.95257e-06 ± 2.93483e-06
  CSA_Chi2/NDF : 2.05973e-04 / 2
  CSA_P0  : 5.67891e-02 ± 9.57255e-03
  CSA_P1  : 1.11180e-02 ± 7.21222e-04
  CSA_P2  : -7.21435e-05 ± 1.09834e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [8, 49]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [60, 73]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3550', '1.800', '0.1293', '1.800', '0.0949', '7.000', '0.7065', 1, 1, 1, 1, 1733823531.164921]
VI_after__Init : ['1.201', '0.3558', '1.800', '0.1293', '1.799', '0.0892', '7.000', '0.7065', 1, 1, 1, 1, 1733823539.2693214]
VI_at__the_End : ['1.202', '0.4637', '1.800', '0.1361', '1.800', '0.1156', '7.000', '0.7072', 1, 1, 1, 1, 1733823606.92513]