TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_21_38
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-007-003-05 | FUSED_ID : 6359364768457846837
  IC_TEMP :  -78.43 | VDDM : 1111.30 | AUX_INT :  -10.08 | CsaBias :   69.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53788e-03 / 2
  ADC_P0  : -1.00751e-02 ± 2.65374e-02
  ADC_P1  : 8.85232e-03 ± 6.71708e-04
  ADC_P2  : -7.06683e-06 ± 3.38352e-06
  CSA_Chi2/NDF : 2.12553e-04 / 2
  CSA_P0  : 5.70435e-02 ± 9.72424e-03
  CSA_P1  : 1.01970e-02 ± 7.32651e-04
  CSA_P2  : -5.96244e-05 ± 1.11574e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [50]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4176', '1.800', '0.1125', '1.800', '0.0967', '7.000', '0.7067', 1, 1, 1, 1, 1733826098.086401]
VI_after__Init : ['1.201', '0.4190', '1.800', '0.1126', '1.800', '0.0905', '7.000', '0.7063', 1, 1, 1, 1, 1733826106.156802]
VI_at__the_End : ['1.201', '0.4578', '1.800', '0.1363', '1.800', '0.1145', '7.000', '0.7076', 1, 1, 1, 1, 1733826166.633055]