TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_16_30
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-007-006-05 | FUSED_ID : 6359364768457846885
  IC_TEMP :  -76.78 | VDDM : 1110.72 | AUX_INT :  -13.10 | CsaBias :   40.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.57401e-03 / 2
  ADC_P0  : -1.31037e-02 ± 3.44219e-02
  ADC_P1  : 8.91687e-03 ± 8.67816e-04
  ADC_P2  : -7.06080e-06 ± 4.39303e-06
  CSA_Chi2/NDF : 1.49694e-04 / 2
  CSA_P0  : 5.81718e-02 ± 8.16064e-03
  CSA_P1  : 1.04747e-02 ± 6.14845e-04
  CSA_P2  : -6.58853e-05 ± 9.36336e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [32, 54]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3970', '1.800', '0.1136', '1.800', '0.0974', '7.000', '0.7070', 1, 1, 1, 1, 1733825790.5594172]
VI_after__Init : ['1.201', '0.3987', '1.800', '0.1138', '1.800', '0.0900', '7.000', '0.7063', 1, 1, 1, 1, 1733825798.7178936]
VI_at__the_End : ['1.201', '0.4509', '1.800', '0.1375', '1.800', '0.1131', '7.000', '0.7069', 1, 1, 1, 1, 1733825859.222126]