TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_13_05
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-007-008-05 | FUSED_ID : 6359364768457846917
  IC_TEMP :  -70.03 | VDDM : 1115.47 | AUX_INT :  -10.12 | CsaBias :   67.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54309e-03 / 2
  ADC_P0  : -1.01223e-02 ± 2.65649e-02
  ADC_P1  : 8.70622e-03 ± 6.56311e-04
  ADC_P2  : -7.13693e-06 ± 3.22009e-06
  CSA_Chi2/NDF : 1.75329e-04 / 2
  CSA_P0  : 5.70132e-02 ± 8.83180e-03
  CSA_P1  : 9.85152e-03 ± 6.65413e-04
  CSA_P2  : -5.42510e-05 ± 1.01334e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3233', '1.800', '0.1492', '1.800', '0.0861', '7.000', '0.7065', 1, 1, 1, 1, 1733825584.925726]
VI_after__Init : ['1.202', '0.3236', '1.800', '0.1493', '1.800', '0.0803', '7.000', '0.7064', 1, 1, 1, 1, 1733825593.035989]
VI_at__the_End : ['1.201', '0.4577', '1.800', '0.1334', '1.800', '0.1104', '7.000', '0.7071', 1, 1, 1, 1, 1733825656.941953]