TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_06_14
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-007-012-05 | FUSED_ID : 6359364768457846981
  IC_TEMP :  -77.56 | VDDM : 1105.64 | AUX_INT :  -10.44 | CsaBias :   60.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75740e-03 / 2
  ADC_P0  : -1.04416e-02 ± 2.84127e-02
  ADC_P1  : 8.89213e-03 ± 7.25850e-04
  ADC_P2  : -6.92644e-06 ± 3.69201e-06
  CSA_Chi2/NDF : 1.68282e-04 / 2
  CSA_P0  : 5.92478e-02 ± 8.65250e-03
  CSA_P1  : 1.01786e-02 ± 6.51904e-04
  CSA_P2  : -6.23508e-05 ± 9.92772e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [43]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0453', '1.800', '0.1609', '1.800', '0.0787', '7.000', '0.7069', 1, 1, 1, 1, 1733825173.6454778]
VI_after__Init : ['1.202', '0.0453', '1.800', '0.1609', '1.800', '0.0733', '7.000', '0.7065', 1, 1, 1, 1, 1733825181.7027898]
VI_at__the_End : ['1.201', '0.4478', '1.800', '0.1338', '1.801', '0.1130', '7.000', '0.7074', 1, 1, 1, 1, 1733825247.9284532]