TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_04_30
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-007-013-05 | FUSED_ID : 6359364768457846997
  IC_TEMP :  -70.24 | VDDM : 1113.14 | AUX_INT :   -9.48 | CsaBias :   67.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53819e-03 / 2
  ADC_P0  : -9.47970e-03 ± 2.66213e-02
  ADC_P1  : 8.61029e-03 ± 6.75476e-04
  ADC_P2  : -5.65516e-06 ± 3.41727e-06
  CSA_Chi2/NDF : 1.77122e-04 / 2
  CSA_P0  : 5.88720e-02 ± 8.87684e-03
  CSA_P1  : 9.99647e-03 ± 6.68806e-04
  CSA_P2  : -5.84270e-05 ± 1.01851e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [36, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3122', '1.800', '0.1498', '1.800', '0.0933', '7.000', '0.7067', 1, 1, 1, 1, 1733825070.391976]
VI_after__Init : ['1.202', '0.3127', '1.800', '0.1499', '1.799', '0.0876', '7.000', '0.7069', 1, 1, 1, 1, 1733825078.4861524]
VI_at__the_End : ['1.202', '0.4517', '1.800', '0.1318', '1.799', '0.1105', '7.000', '0.7072', 1, 1, 1, 1, 1733825143.7869415]