TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_01_05
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-007-015-05 | FUSED_ID : 6359364768457847029
  IC_TEMP :  -76.33 | VDDM : 1121.70 | AUX_INT :  -10.25 | CsaBias :   52.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57191e-03 / 2
  ADC_P0  : -1.02484e-02 ± 2.68476e-02
  ADC_P1  : 9.01349e-03 ± 6.96670e-04
  ADC_P2  : -6.98921e-06 ± 3.60543e-06
  CSA_Chi2/NDF : 1.80774e-04 / 2
  CSA_P0  : 6.02380e-02 ± 8.96790e-03
  CSA_P1  : 1.04339e-02 ± 6.75666e-04
  CSA_P2  : -6.50976e-05 ± 1.02896e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [71, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3736', '1.800', '0.1790', '1.799', '0.0944', '7.000', '0.7065', 1, 1, 1, 1, 1733824865.0407505]
VI_after__Init : ['1.202', '0.3750', '1.800', '0.1796', '1.800', '0.0887', '7.000', '0.7069', 1, 1, 1, 1, 1733824873.745061]
VI_at__the_End : ['1.202', '0.4545', '1.800', '0.1357', '1.799', '0.1087', '7.004', '0.7074', 1, 1, 1, 1, 1733824934.6809793]