TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_23_21
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-008-002-01 | FUSED_ID : 6359364768457850913
  IC_TEMP :  -76.02 | VDDM : 1115.53 | AUX_INT :   -8.27 | CsaBias :   36.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08454e-03 / 2
  ADC_P0  : -8.27055e-03 ± 2.22312e-02
  ADC_P1  : 9.09032e-03 ± 5.76146e-04
  ADC_P2  : -7.94420e-06 ± 2.94893e-06
  CSA_Chi2/NDF : 1.73793e-04 / 2
  CSA_P0  : 5.80548e-02 ± 8.79303e-03
  CSA_P1  : 1.03757e-02 ± 6.62492e-04
  CSA_P2  : -6.11425e-05 ± 1.00890e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [11]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [27]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4522', '1.800', '0.1672', '1.800', '0.0965', '7.000', '0.7067', 1, 1, 1, 1, 1733826200.8154695]
VI_after__Init : ['1.201', '0.4546', '1.800', '0.1682', '1.800', '0.0911', '7.000', '0.7068', 1, 1, 1, 1, 1733826208.881865]
VI_at__the_End : ['1.201', '0.4635', '1.800', '0.1387', '1.802', '0.1125', '7.000', '0.7075', 1, 1, 1, 1, 1733826270.8399768]