TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_38_49
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-008-011-01 | FUSED_ID : 6359364768457851057
  IC_TEMP :  -72.70 | VDDM : 1078.11 | AUX_INT :   -4.87 | CsaBias :   60.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.50220e-04 / 2
  ADC_P0  : -4.87304e-03 ± 1.43000e-02
  ADC_P1  : 9.34571e-03 ± 3.91958e-04
  ADC_P2  : -7.80840e-06 ± 2.10983e-06
  CSA_Chi2/NDF : 1.79827e-05 / 2
  CSA_P0  : 2.66016e-01 ± 2.82846e-03
  CSA_P1  : 4.43375e-03 ± 2.13104e-04
  CSA_P2  : -2.46188e-05 ± 3.24532e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [62, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2404', '1.800', '0.1635', '1.800', '0.0905', '7.000', '0.7065', 1, 1, 1, 1, 1733827128.5033233]
VI_after__Init : ['1.202', '0.2411', '1.800', '0.1636', '1.800', '0.0852', '7.000', '0.7070', 1, 1, 1, 1, 1733827136.7697067]
VI_at__the_End : ['1.201', '0.4469', '1.800', '0.1359', '1.804', '0.1118', '7.000', '0.7073', 1, 1, 1, 1, 1733827200.8047523]