TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_40_32
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-008-012-01 | FUSED_ID : 6359364768457851073
  IC_TEMP :  -73.67 | VDDM : 1125.57 | AUX_INT :  -11.26 | CsaBias :   34.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.96585e-03 / 2
  ADC_P0  : -1.12609e-02 ± 3.00039e-02
  ADC_P1  : 9.17504e-03 ± 7.71883e-04
  ADC_P2  : -8.23352e-06 ± 3.94739e-06
  CSA_Chi2/NDF : 1.78216e-04 / 2
  CSA_P0  : 6.03670e-02 ± 8.90420e-03
  CSA_P1  : 1.04863e-02 ± 6.70868e-04
  CSA_P2  : -6.49749e-05 ± 1.02165e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  34
 | P_BROKEN_FAST :  [102, 120]
 | P_BROKEN_SLOW :  [2, 6, 10, 14, 18, 22, 26, 30, 34, 38, 42, 46, 50, 54, 58, 62, 66, 70, 74, 78, 82, 86, 90, 94, 98, 102, 106, 110, 114, 118, 122, 126]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1294', '1.800', '0.1509', '1.800', '0.0840', '7.000', '0.7065', 1, 1, 1, 1, 1733827231.9782858]
VI_after__Init : ['1.202', '0.1295', '1.800', '0.1510', '1.800', '0.0780', '7.000', '0.7064', 1, 1, 1, 1, 1733827240.1805909]
VI_at__the_End : ['1.201', '0.4613', '1.800', '0.1353', '1.802', '0.1137', '7.000', '0.7070', 1, 1, 1, 1, 1733827303.0167239]