TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_42_15
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-008-013-01 | FUSED_ID : 6359364768457851089
  IC_TEMP :  -72.46 | VDDM : 1124.81 | AUX_INT :   -9.06 | CsaBias :   53.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25633e-03 / 2
  ADC_P0  : -9.06225e-03 ± 2.39746e-02
  ADC_P1  : 8.93157e-03 ± 6.17787e-04
  ADC_P2  : -7.00969e-06 ± 3.16293e-06
  CSA_Chi2/NDF : 1.72216e-04 / 2
  CSA_P0  : 5.82135e-02 ± 8.75304e-03
  CSA_P1  : 1.02526e-02 ± 6.59479e-04
  CSA_P2  : -6.20598e-05 ± 1.00431e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [20, 36]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3467', '1.800', '0.1515', '1.799', '0.0904', '7.000', '0.7065', 1, 1, 1, 1, 1733827334.8913267]
VI_after__Init : ['1.201', '0.3473', '1.800', '0.1516', '1.801', '0.0850', '7.000', '0.7063', 1, 1, 1, 1, 1733827342.9176497]
VI_at__the_End : ['1.201', '0.4553', '1.800', '0.1349', '1.802', '0.1137', '7.000', '0.7072', 1, 1, 1, 1, 1733827405.8208182]