TEST_NAME : Wafer
TEST_DATE : 24_12_10-11_55_46
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-008-021-06 | FUSED_ID : 6359364768457851222
  IC_TEMP :  -72.73 | VDDM : 1115.06 | AUX_INT :  -10.32 | CsaBias :   61.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46905e-03 / 2
  ADC_P0  : -1.03209e-02 ± 2.58834e-02
  ADC_P1  : 9.03026e-03 ± 6.59383e-04
  ADC_P2  : -7.78182e-06 ± 3.34238e-06
  CSA_Chi2/NDF : 1.77145e-04 / 2
  CSA_P0  : 5.83236e-02 ± 8.87743e-03
  CSA_P1  : 1.03999e-02 ± 6.68850e-04
  CSA_P2  : -6.19355e-05 ± 1.01858e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3009', '1.800', '0.1311', '1.800', '0.0919', '7.000', '0.7069', 1, 1, 1, 1, 1733828145.9283633]
VI_after__Init : ['1.201', '0.3012', '1.800', '0.1313', '1.800', '0.0859', '7.000', '0.7070', 1, 1, 1, 1, 1733828154.14884]
VI_at__the_End : ['1.201', '0.4623', '1.800', '0.1349', '1.804', '0.1167', '7.000', '0.7076', 1, 1, 1, 1, 1733828215.5180147]